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Effect of Ni on the growth and photoelectrochemical properties of ZnS thin films

机译:镍对ZnS薄膜生长和光电化学性能的影响

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摘要

Undoped and Ni-doped ZnS thin film photoelectrodes were prepared using the chemical bath deposition process. X-ray diffraction patterns of a hexagonal wurtzite structure with preferential orientation along the (008) plane appeared on undoped ZnS films. An increase in the molar ratios of Ni, x, in the starting solution resulted in a decrease in the intensity of the (008) plane. Images from a scanning electron microscope revealed a drastic change of the surface morphology of the Ni-doped ZnS film due to ion-by-ion deposition. The energy band gaps of Ni-doped ZnS thin films shifted to lower energy levels between 3.34 and 3.01 eV. Moreover, increasing the Ni ratio led to a shift in the flat-band potential of the film towards a more positive value compared to that of ZnS. The Ni-doped ZnS films experienced a conversion from n-type to p-type when the molar ratio of Ni changed from 0.003 to 0.005. The photocurrent densities of Ni-doped ZnS film (x = 0.003) reached 3.74 mAcm ~(-2) at an external potential of 1.5 V versus a Pt electrode and exhibited a threefold enhancement of photocurrent density compared to pure ZnS. A cathodic photocurrent of 0.82 mAcm~(-2) at an external potential of -1.5 V was obtained for a Ni concentration of x = 0.005.
机译:使用化学浴沉积工艺制备了未掺杂和镍掺杂的ZnS薄膜光电极。在未掺杂的ZnS薄膜上出现了沿(008)平面优先取向的六角纤锌矿结构的X射线衍射图。起始溶液中Ni,x的摩尔比的增加导致(008)面的强度降低。扫描电子显微镜的图像显示,由于离子沉积,Ni掺杂的ZnS膜的表面形态发生了巨大变化。 Ni掺杂的ZnS薄膜的能带隙转移到了3.34和3.01 eV之间的较低能级。而且,增加Ni比导致膜的平带电势向比ZnS更正的值移动。当Ni的摩尔比从0.003变为0.005时,掺杂Ni的ZnS膜经历从n型到p型的转变。 Ni掺杂的ZnS薄膜(x = 0.003)在外部电压为1.5 V时相对于Pt电极的光电流密度达到3.74 mAcm〜(-2),与纯ZnS相比,光电流密度提高了三倍。对于Ni = x = 0.005,在-1.5V的外部电势下获得0.82mAcm·(-2)的阴极光电流。

著录项

  • 来源
    《Materials Chemistry and Physics.》 |2009年第1期|156-162|共7页
  • 作者单位

    Department of Environmental Engineering, Kun Shan University, Yung Kang City, Tainan, Taiwan;

    Department of Polymer Materials, Kun Shan University, Yung Kang City, Tainan, Taiwan;

    Department of Chemical Engineering and Biotechology, National Taipei University of Technology, Taipei, Taiwan;

    Department of Chemical Engineering and Biotechology, National Taipei University of Technology, Taipei, Taiwan;

    Energy and Environment Research Laboratories, Industrial Technology Research Institute, Hsinchu, Taiwan;

    Department of Chemical and Materials Engineering, Chang Gung University, No. 259 Wen-Hwa 1st Rd., Kwei-Shan, Taoyuan 333, Taiwan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    semiconductors; chemical synthesis; electrical properties; thin films;

    机译:半导体;化学合成电性能;薄膜;

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