首页> 外文期刊>Materials Chemistry and Physics. >The electron transfer behavior of the hydrogen-terminated boron-doped diamond film electrode
【24h】

The electron transfer behavior of the hydrogen-terminated boron-doped diamond film electrode

机译:氢封端的硼掺杂金刚石膜电极的电子转移行为

获取原文
获取原文并翻译 | 示例
           

摘要

To clarify the electron transfer behavior of the hydrogen-terminated boron-doped diamond film electrode in an electrolytic solution, its detailed electronic structures were investigated by using scanning probe microscopy and ab initio methods. The interface structure of the hydrogen-terminated diamond electrode and the electrolyte was also studied by means of cyclic voltammetry and AC impedance spectroscopy. The results showed that there exist shallow acceptors in the band gap of the hydrogenated diamond films. Neither the surface hydrogen alone nor the subsurface hydrogen could induce the shallow acceptors, though they interact strongly with the surface carbon atoms or subsurface carbon and boron atoms in the diamond film. It is the interaction of the surface adsorbates and the surface C-H bonding that gives rise to the shallow acceptors in the band gap of the hydrogenated diamond film. The surface shallow acceptors in the band gap of the hydrogenated diamond film could lower the energy barrier of the electron transfer between the diamond electrode and the electrolytic solution. Thus, electrochemical window for the hydrogenated diamond film is narrower and, its film resistance and capacitance are also smaller than those of the oxygenated one. In our work, the experimental data obtained by using scanning probe microscopy are in good agreement with the calculation results.
机译:为了阐明氢端掺杂硼的金刚石薄膜电极在电解液中的电子转移行为,使用扫描探针显微镜和从头算方法研究了其详细的电子结构。还通过循环伏安法和交流阻抗谱研究了氢封端金刚石电极和电解质的界面结构。结果表明,在氢化金刚石薄膜的带隙中存在浅受体。尽管表面氢或表面氢与金刚石薄膜中的表面碳原子或表面碳和硼原子强烈相互作用,但无论表面氢还是表面氢都不能诱导这些浅受体。表面被吸附物与表面C-H键的相互作用在氢化金刚石薄膜的带隙中产生浅受体。氢化金刚石膜带隙中的表面浅受体可以降低金刚石电极与电解液之间电子转移的能垒。因此,氢化金刚石膜的电化学窗口更窄,并且其膜电阻和电容也小于氧化金刚石膜的电化学窗口。在我们的工作中,使用扫描探针显微镜获得的实验数据与计算结果非常吻合。

著录项

  • 来源
    《Materials Chemistry and Physics.》 |2009年第3期|590-598|共9页
  • 作者单位

    State Key Laboratory of Tribology, Tsinghua University, Beijing 100084, China;

    State Key Laboratory of Tribology, Tsinghua University, Beijing 100084, China;

    State Key Laboratory of Tribology, Tsinghua University, Beijing 100084, China;

    State Key Laboratory of Tribology, Tsinghua University, Beijing 100084, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    surfaces; thin films; electrochemical properties; electronic structure;

    机译:表面;薄膜;电化学性能电子结构;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号