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Electrical and dielectric properties of (Ba0.5Sr0.5)TiO3 thin films prepared by a hydroxide-alkoxide precursor-based sol-gel method

机译:氢氧化物-醇盐前体基溶胶-凝胶法制备的(Ba0.5Sr0.5)TiO3薄膜的电和介电性能

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Thin films of barium strontium titanate with composition (Ba0.5Sr0.5)TiO3 were prepared by a sol-gel method using Ba-, Sr-hydroxides, titanium(IV) isopropoxide as source materials and 2-methoxyethanol as the solvent. Well-crystallised films were obtained at relatively low temperatures. We observed grain growth accompanied with increase in the dielectric constant as the annealing temperature increased. The films prepared from this method and annealed at 800degreesC showed high dielectric constant of 650. Typical leakage current density of the film annealed at 700degreesC is 0.8 x 10(-6) at 75 W cm(-1). The change in electrical characteristics of the films has been correlated to their microstructure, which revealed that the concentration change affected the film porosity and grain size distribution. The results indicate that the microstructure could be tailored by changing the precursor solution concentration. (C) 2002 Elsevier Science B.V. All rights reserved. [References: 26]
机译:采用Ba-,Sr-氢氧化物,异丙醇钛(IV)为原料,2-甲氧基乙醇为溶剂,通过溶胶-凝胶法制备了组成为(Ba0.5Sr0.5)TiO3的钛酸锶钡薄膜。在相对较低的温度下获得了良好结晶的膜。我们观察到随着退火温度的升高,晶粒的生长伴随介电常数的增加。用这种方法制备并在800℃退火的薄膜显示出650的高介电常数。在700 W退火的薄膜在75 W cm(-1)的典型漏电流密度为0.8 x 10(-6)。薄膜电学特性的变化与它们的微观结构有关,这表明浓度的变化会影响薄膜的孔隙率和粒度分布。结果表明,可以通过改变前体溶液浓度来调整微观结构。 (C)2002 Elsevier Science B.V.保留所有权利。 [参考:26]

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