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Significant Improvement of Unipolar n-Type Transistor Performances by Manipulating the Coplanar Backbone Conformation of Electron-Deficient Polymers via Hydrogen Bonding

机译:通过氢键处理电子不足的聚合物的共面主干构型,可显着改善单极n型晶体管的性能

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摘要

The development of high-performance unipolar n-type semiconducting polymers still remains a significant challenge. Only a few examples exhibit a unipolar electron mobility over 5 cm(2) V-1 s(-1). In this study, a series of new poly(benzothiadiazole-naphthalenediimide) derivatives with a high unipolar electron mobility (mu(e)) up to 7.16 cm(2) V-1 s(-1) in thin-film transistors are reported. The dramatically increased mu(e) is achieved by finely optimizing the coplanar backbone conformation through the introduction of vinylene bridges, which can form intramolecular hydrogen bonds with the neighboring fluorine and oxygen atoms. The hydrogen-bonding functionalities are fused to the backbone to ensure a much more planar conformation of the conjugated pi-system, as demonstrated by the density functional theory (DFT)-based calculations. The theoretical prediction is in good agreement with the experimental results. As the coplanarity is promoted by the hydrogen bonding, the thin-film crystallinity and molecular packing strength are also improved, which is evidenced by the synchrotron two-dimensional grazing-incidence wide-angle X-ray scattering (GIWAXS) and atomic force microscopy (AFM) measurements. Notably, the GIVVAXS measurements reveal an extremely short pi-pi stacking distance of 3.40 angstrom. Overall, this study marks a significant advance in the unipolar n-type semiconducting polymers and offers a general approach for further increasing the electron mobility of semiconducting polymers in organic electronics.
机译:高性能单极n型半导体聚合物的开发仍然是一个重大挑战。只有几个示例在5 cm(2)V-1 s(-1)上显示出单极电子迁移率。在这项研究中,一系列新的聚(苯并噻二唑-萘二酰亚胺)衍生物在薄膜晶体管中具有高达7.16 cm(2)V-1 s(-1)的高单极电子迁移率(mu(e))。通过引入亚乙烯基桥精细地优化共面主链构象,可以显着提高mu(e),该桥可以与相邻的氟和氧原子形成分子内氢键。氢键官能团被融合到主链上,以确保共轭pi系统具有更多的平面构象,这由基于密度泛函理论(DFT)的计算所证明。理论预测与实验结果吻合良好。由于氢键促进了共面性,薄膜的结晶度和分子堆积强度也得到了改善,这由同步加速器二维掠射入射广角X射线散射(GIWAXS)和原子力显微镜证实( AFM)测量。值得注意的是,GIVVAXS测量显示出3.40埃的极短pi-pi堆叠距离。总体而言,这项研究标志着单极性n型半导体聚合物的重大进步,并为进一步提高有机电子在半导体中的电子迁移率提供了一种通用方法。

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  • 来源
    《Journal of the American Chemical Society》 |2019年第8期|3566-3575|共10页
  • 作者单位

    Tokyo Inst Technol, Dept Mat Sci & Engn, Meguro Ku, 2-12-1 Ookayama, Tokyo 1528552, Japan;

    Tokyo Inst Technol, Dept Mat Sci & Engn, Meguro Ku, 2-12-1 Ookayama, Tokyo 1528552, Japan;

    Tokyo Inst Technol, Dept Mat Sci & Engn, Meguro Ku, 2-12-1 Ookayama, Tokyo 1528552, Japan;

    Tokyo Inst Technol, Dept Mat Sci & Engn, Meguro Ku, 2-12-1 Ookayama, Tokyo 1528552, Japan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);美国《化学文摘》(CA);
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  • 正文语种 eng
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