Achieving yield construction and process analysis in TFT-LCD industry based on critical layers and areas

K-L Hsieh

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Achieving yield construction and process analysis in TFT-LCD industry based on critical layers and areas

机译：基于关键层和面积，在TFT-LCD行业中实现良率构建和工艺分析

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摘要

In this study, a procedure is proposed to address achieving yield construction and process analysis in TFT-LCD industry based on critical layers and areas. Besides, an illustrative case owing to TFT-LCD manufacturer at Tainan Science Park in Taiwan has been applied to verify rationality and feasibility of proposed procedure.

机译：在这项研究中，提出了一种程序来解决基于关键层和面积的TFT-LCD行业中的良率构建和工艺分析。此外，以台湾台南科学园的TFT-LCD生产商为例，说明了所提出程序的合理性和可行性。

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来源
《Journal of Scientific & Industrial Research》 |2007年第11期|p.891-897|共7页
作者
K-L Hsieh;
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作者单位

Department of Information Management, National Taitung University, 684, Chung Hua Rd, Sector 1, Taitung, Taiwan, R O C;

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收录信息美国《科学引文索引》(SCI);
原文格式 PDF
正文语种 eng
中图分类自然科学总论;
关键词
backpropagation neural network model; critical areas; critical layers; liquid crystal displays (LCDs); stepwise regression technique;

机译：反向传播神经网络模型关键区域关键层液晶显示器逐步回归技术;

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Achieving yield construction and process analysis in TFT-LCD industry based on critical layers and areas

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