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Improvement in fundamental electronic properties of Bi-2212 electroceramics with trivalent Bi/Tm substitution: a combined experimental and empirical model approach

机译:双2212电烧芯的基本电子特性提高三价双/ TM替代:一种实验和经验模型方法

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摘要

This study delves into the variation in the fundamental aspects of electrical quantities with the partial substitution of Tm impurities at Bi-site in the Bi_(2.1-x)Tm_xSr_(2.0)Ca_(1.1)Cu_(2.0)O_y (0.00 ≤ x≤ 0.30) ceramic system with the derivatives of electrical resistivity examinations and theoretical approaches. It is found that all the electrical characteristic properties tend to improve with the trivalent Bi/Tm substitution level up to x = 0.07 beyond which they degrade considerably due to the increment of non-superconducting barrier regions, permanent disorders, inhomogeneity, porosity, grain misorientation distribution, internal and surface omnipresent defects, microscopic cracks, and coupling interaction problems throughout the grain boundaries in the Bi-2212 crystal system. Thus, the optimum dopant level of x = 0.07 results in the transition from the over-doped state to optimally doped state in the Bi-2212 crystal system as a consequence of augmented hybridization mechanism. Further, the characteristic two-stage transition temperatures, gap coefficient, Josephson coupled, and thermal energies for the isolated grains and inter-grains are explored. The findings show that the optimum Bi/Tm substitution leads not only to stabilize the superconductivity in the homogeneous superconducting clusters as a result of the increment in the formation of active Cooper pairs but also to decrease significantly the location of resistivity in long-range coherent state due to the increment of hole trap energy. Additionally, a strong link is established between the structural disorders-defects and onset/offset (T_c~(onset)/T_c~(offset)) transition temperatures using the electrical resistivity features for the first time. The empirical model based on the impurity scattering and lattice strain in the crystal lattices displays that it is possible to achieve the possible highest T_c~(onset) and T_c~(offset) values of about 86.558 K and 86.445 K, respectively. To sum up, the paper with strong methodology between electrical quantities and structural disorders-defects depending on Tm impurity may be a pioneering research to explain why the characteristic features improve with the optimum substitution and especially open up a novel and feasible area for the advanced engineering, heavy industrial technology, and large-scale applications of ceramic materials.
机译:本研究涉及在Bi_(2.1-x)TM_XSR_(2.0)CA_(1.1)CU_(2.0)O_Y(0.00≤x≤0.00)的双位点(2.1- x)CA_(1.1)中的TM杂质的电量基本方面的变化。(1.1)CU_(2.0)O_Y(0.00≤x≤ 0.30)陶瓷系统具有电阻率检查的衍生物和理论方法。结果发现,由于非超导阻挡区,永久性障碍,不均匀性,孔隙度,晶体杂散,晶粒杂散,晶体杂散,晶体扰动在Bi-2212晶体系统中的整个晶界中的分布,内部和表面全峰缺陷,微观裂缝和耦合相互作用问题。因此,X = 0.07的最佳掺杂剂水平导致从超掺杂状态转变为Bi-2212晶体系统中的最佳掺杂状态,因此由于增强的杂交机制而导致的。此外,探讨了孤立的颗粒和颗粒的特征两级转变温度,间隙系数,约瑟夫森耦合和热能。结果表明,最佳BI / TM取代导致由于在形成有源库对的形成中的增量而导致均匀超导簇中的超导性,但也可以在远程相干状态下显着降低电阻率的位置由于孔陷阱能量的增量。另外,在结构紊乱缺陷和起始/偏移(T_C〜(ONSET)/ T_C〜(OFFSET)之间建立了强的链接,首次使用电阻率特征的过渡温度。基于晶体晶格中的杂质散射和晶格应变的经验模型显示,可以分别实现约86.558k和86.445k的可能的最高T_c〜(opset)和t_c〜(偏移)值。总而言之,根据TM杂质的电量和结构紊乱缺陷之间具有强大方法的论文可能是开创性的研究,以解释为什么特征特征随着最佳替代而改善,特别是为先进工程开辟新颖可行的区域,重工业技术,陶瓷材料大规模应用。

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  • 来源
    《Journal of materials science》 |2021年第14期|19846-19858|共13页
  • 作者单位

    Department of Electricity and Energy Osmaniye Korkut Ata University 80000 Osmaniye Turkey;

    Scientific and Technological Research Application Center Kirikkale University 71450 Kirikkale Turkey;

    Department of Mechanical Engineering Abant Izzet Baysal University 14280 Bolu Turkey;

    Department of Mechanical Engineering Abant Izzet Baysal University 14280 Bolu Turkey;

    Department of Architecture Sakarya University 54187 Sakarya Turkey;

    Department of Mechanical Engineering Abant Izzet Baysal University 14280 Bolu Turkey;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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