Raman Spectroscopy of Nanocrystalline Ceria and Zirconia Thin Films

摘要

The results of Raman-scattering studies of nanocrystalline CeO_2 and ZrO_2:16% Y (YSZ) thin films are presented. The relationship between the lattice disorder and the form of the Raman spectra is discussed and correlated with the micro-structure. It is shown that the Raman line shape results from phonon confinement and spatial correlation effects and yields information about the material nonstoichiometry level.