首页> 外文期刊>Journal of Electronic Packaging >Characterization of the Solder Paste Release From Small Stencil Apertures in the Stencil Printing Process
【24h】

Characterization of the Solder Paste Release From Small Stencil Apertures in the Stencil Printing Process

机译:模版印刷过程中小模版孔中焊膏释放的特征

获取原文
获取原文并翻译 | 示例
           

摘要

Stencil printing is a critical first step in surface mount assembly. However, its robustness can be called into question because of the fact that about 50% or more of the defects found in the assembly of printed circuit boards (PCBs) are attributed to stencil printing. Manufacturing techniques for the assembly of certain flip chips, chip scale packages, 0201s, and fine pitch ball grid arrays are testing the limits of current stencil printing capabilities. This paper focuses on understanding the release of solder paste from the stencil, based on experimental and modeling approaches. The primary goal of the study-is to characterize the performance of various aperture sizes and geometries based on release efficiencies and to compare them to predictions. The resulting model validation helps us better understand the print process for small features and offers options for increasing print yields. The study is divided into two phases. The first phase examines the release performance of various solder pastes from a variety of aperture sizes and geometries. The focus of this study is a comparison of square versus circular apertures when the nominal volume of paste to be deposited is kept constant. The second phase consists of developing a model that predicts paste-release efficiencies from small apertures and validating the model with experimental results.
机译:模版印刷是表面贴装装配中至关重要的第一步。但是,由于其在印刷电路板(PCB)组装中发现的大约50%或更多的缺陷归因于模版印刷,因此其坚固性值得质疑。用于组装某些倒装芯片,芯片级封装,0201和细间距球栅阵列的制造技术正在测试当前模板印刷功能的极限。本文基于实验和建模方法,着重于了解模板中焊膏的释放。这项研究的主要目标是根据释放效率表征各种孔径和几何形状的性能,并将其与预测结果进行比较。进行的模型验证有助于我们更好地了解小特征的打印过程,并提供提高打印产量的选项。该研究分为两个阶段。第一阶段检查各种孔径和几何形状的各种焊膏的脱模性能。本研究的重点是当要沉积的浆料的标称体积保持恒定时,将正方形孔与圆形孔进行比较。第二阶段包括开发一个模型,该模型可预测小孔的糊剂释放效率,并通过实验结果验证该模型。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号