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Single-image super-resolution based on Markov random field and contourlet transform

机译:基于马尔可夫随机场和Contourlet变换的单图像超分辨率

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摘要

Learning-based methods are well adopted in image super-resolution. In this paper, we propose a new learning-based approach using contourlet transform and Markov random field. The proposed algorithm employs contourlet transform rather than the conventional wavelet to represent image features and takes into account the correlation between adjacent pixels or image patches through the Markov random field (MRF) model. The input low-resolution (LR) image is decomposed with the contourlet transform and fed to the MRF model together with the contourlet transform coefficients from the low- and high-resolution image pairs in the training set. The unknown high-frequency components/coefficients for the input low-resolution image are inferred by a belief propagation algorithm. Finally, the inverse contourlet transform converts the LR input and the inferred high-frequency coefficients into the super-resolved image. The effectiveness of the proposed method is demonstrated with the experiments on facial, vehicle plate, and real scene images. A better visual quality is achieved in terms of peak signal to noise ratio and the image structural similarity measurement.
机译:基于学习的方法在图像超分辨率中得到了很好的采用。在本文中,我们提出了一种使用轮廓波变换和马尔可夫随机场的基于学习的新方法。该算法采用轮廓波变换而不是传统的小波来表示图像特征,并通过马尔可夫随机场(MRF)模型考虑了相邻像素或图像块之间的相关性。输入的低分辨率(LR)图像通过Contourlet变换分解,并与来自训练集中低分辨率和高分辨率图像对的Contourlet变换系数一起馈入MRF模型。通过置信传播算法推断输入的低分辨率图像的未知高频分量/系数。最后,逆轮廓波变换将LR输入和推断的高频系数转换成超分辨图像。通过面部,车辆牌照和真实场景图像上的实验证明了该方法的有效性。就峰值信噪比和图像结构相似性测量而言,可获得更好的视觉质量。

著录项

  • 来源
    《Journal of electronic imaging》 |2011年第2期|p.023005.1-023005.17|共17页
  • 作者单位

    Sichuan University School of Electronics and Information Engineering Chengdu, 610064 China;

    University of Ottawa School of Information Technology and Engineering Ottawa, Ontario, K1A 0R6 Canada;

    University of Ottawa School of Information Technology and Engineering Ottawa, Ontario, K1A 0R6 Canada;

    Sichuan University School of Electronics and Information Engineering Chengdu, 610064 China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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