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Homoepitaxial ZnO film growth on vertically aligned ZnO nanorods

机译:在垂直排列的ZnO纳米棒上生长同质外延ZnO膜

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摘要

We present a 2D ZnO film epitaxially grown on 1D ZnO nanorods with catalyst-free metal-organic chemical vapor deposition. Vertically aligned ZnO nanorods were synthesized on Al_2O_3 substrates, and subsequently, a ZnO film was deposited on the pre-grown ZnO nanorods in situ. The dimensional ZnO growth was controlled by the growth chamber pressure. High-resolution X-ray diffraction and field-emission transmission electron microscope measurements demonstrated that the ZnO film was epitaxially grown on the pre-grown ZnO nanorods, and that the ZnO filmanorods structures had a well-ordered wurtzite structure. The ZnO film on ZnO nanorods/ Al_2O_3 had a uniform thickness with an average minimum thickness of 0.25 μm and the root-mean-square roughness of 3 nm determined by Filed-emission scanning electron microscope and an atomic force microscopy measurements, respectively. These ZnO filmanorods hybrid structures can be used as nanobuilding blocks for nanodevice applications.
机译:我们提出了无催化剂的金属有机化学气相沉积在1D ZnO纳米棒上外延生长的2D ZnO膜。在Al_2O_3衬底上合成了垂直排列的ZnO纳米棒,然后在原位生长的ZnO纳米棒上沉积ZnO膜。 ZnO的尺寸生长受生长室压力的控制。高分辨率X射线衍射和场发射透射电子显微镜测量表明ZnO膜外延生长在预先生长的ZnO纳米棒上,并且ZnO膜/纳米棒结构具有良好的纤锌矿结构。 ZnO纳米棒/ Al_2O_3上的ZnO膜具有均匀的厚度,通过场发射扫描电子显微镜和原子力显微镜测量分别确定了0.25μm的平均最小厚度和3nm的均方根粗糙度。这些ZnO膜/纳米棒的杂化结构可用作纳米器件应用的纳米构件。

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