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机译:Fin形状对10nm以下FinFET的影响
Department of Electronics Science and Technology School of Physics and Technology Wuhan University">(1);
Department of Electronics Science and Technology School of Physics and Technology Wuhan University">(1);
Department of Electronics Science and Technology School of Physics and Technology Wuhan University">(1);
Department of Electronics Science and Technology School of Physics and Technology Wuhan University">(1);
Department of Electronics Science and Technology School of Physics and Technology Wuhan University">(1);
FinFET; Fin shape; NEGF; Fin ratio factor; NanoTCAD;
机译:Fin形状对低于10 nm FinFET的影响
机译:锥形FinFET的鳍形对5nm节点CMOS技术中器件性能的影响
机译:鳍宽度变化对带有圆鳍角和锥形鳍形状的16 nm FinFET的性能的影响
机译:取决于Fin形状和TSV以及3D集成电路中背栅噪声耦合的FinFET电性能仿真。
机译:随机离散掺杂剂引起的具有固定顶鳍宽度的16nm栅极梯形体FinFET器件的电特性波动
机译:20 nm双栅极FinFET的梯形鳍对电路电学特性的影响