首页> 外文期刊>Journal of Applied Physics >Topological states ruled by stacking faults in face='verdana'>Bi2 face='verdana'>Se3 and face='verdana'>Bi2 face='verdana'>Te3
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Topological states ruled by stacking faults in face='verdana'>Bi2 face='verdana'>Se3 and face='verdana'>Bi2 face='verdana'>Te3

机译: face ='verdana'> Bi 2 face ='verdana'> Se 3 face ='verdana'> Bi 2 face ='verdana'> Te 3

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摘要

Extended defects like stacking faults (SFs) can originate topologically protected metallic states in bulk topological insulators (TIs). These induced topological states are a response to the weakening of the inter-layer van der Waals interactions due to the SF defect. In TI thin films, the degeneracy of Dirac bands of opposite surfaces can be lifted upon the formation of SF defects. Such slab asymmetry can promote a net spin current, in the absence of backscattering processes, in thin film made of TIs. These results have been obtained by fully relativistic first principles calculations.
机译:诸如堆垛层错(SF)之类的扩展缺陷可能会在体拓扑绝缘体(TI)中产生受拓扑保护的金属态。这些诱发的拓扑状态是对由于SF缺陷导致的层间范德华相互作用减弱的响应。在TI薄膜中,可以在形成SF缺陷时消除相对表面的狄拉克带的简并性。在没有反向散射过程的情况下,由TI制成的薄膜中的这种平板非对称性可以促进净自旋电流。这些结果是通过完全相对论的第一性原理计算获得的。

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