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An analysis of defects induced by high dose γ-ray irradiation and their influence on the charge transport properties in CdZnTe detectors

机译:高剂量γ射线辐照引起的缺陷及其对CdZnTe探测器中电荷输运性能的影响分析

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摘要

Radiation damage effects were important issues for the development of CdZnTe detectors in space-exploration field applications. In this study, we explored the radiation damage mechanisms on CdZnTe crystals based on the Kinchin-Pease model. The type and evolution of irradiation induced defects under different gamma ray doses were investigated by the photoluminescent technique. Laser beam induced transient current measurement was applied to investigate the influence of defects on the charge transport property. Our results demonstrated that the radiation induced defects accumulated negative space charges, which significantly distorted the electric field distribution and reduced electron mobility by enhancing the ionized impurities scattering effect. By correlating the results with Am-241 gamma ray radiation response spectra measurement, the effects of radiation damage on the detector performance were discussed.
机译:辐射损伤效应是CdZnTe探测器在空间探测领域应用中发展的重要问题。在本研究中,我们基于Kinchin-Pease模型探索了CdZnTe晶体的辐射损伤机理。通过光致发光技术研究了在不同伽马射线剂量下辐照引起的缺陷的类型和演变。激光束感应瞬态电流测量用于研究缺陷对电荷传输性能的影响。我们的结果表明,辐射引起的缺陷会积聚负的空间电荷,这会通过增强电离杂质的散射效应而严重扭曲电场分布并降低电子迁移率。通过将结果与Am-241γ射线辐射响应光谱测量结果进行关联,讨论了辐射损伤对探测器性能的影响。

著录项

  • 来源
    《Journal of Applied Physics》 |2020年第2期|024501.1-024501.7|共7页
  • 作者单位

    Xiamen Univ Technol Fujian Prov Key Lab Optoelect Technol & Devices Xiamen 361024 Peoples R China|Northwestern Polytech Univ State Key Lab Solidificat Proc Xian 710072 Peoples R China;

    Northwestern Polytech Univ State Key Lab Solidificat Proc Xian 710072 Peoples R China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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