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Temperature-dependent carrier mobility and threshold voltage of field-effect transistors with tetracene single crystals

机译:并四苯单晶场效应晶体管的温度相关载流子迁移率和阈值电压

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摘要

Temperature-dependent carrier mobility and threshold voltage of organic field effect transistors (OFET) with tetracene single crystals pressed onto a SiO_2/Si substrate were measured in the temperature range between 80 and 300 K. The mobility increases with decreasing temperature, reaching a maximum at 240 K. Further reduction of temperature leads to the decrease of the mobility, before leveling out below 140 K. We find that the critical temperature is strongly correlated with that of the threshold voltage which depends on the number of carriers captured in deep traps. From these temperature-dependent OFET characteristics, a carrier transport model including shallow and deep traps is suggested.
机译:在80至300 K的温度范围内,测量并四苯单晶压在SiO_2 / Si衬底上的有机场效应晶体管(OFET)随温度变化的载流子迁移率和阈值电压。迁移率随温度降低而增加,在60°C时达到最大值。 240K。温度进一步降低导致迁移率降低,然后降至140 K以下。我们发现临界温度与阈值电压密切相关,该阈值电压取决于深陷阱中捕获的载流子数量。根据这些与温度相关的OFET特性,提出了一个包含浅陷阱和深陷阱的载流子传输模型。

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  • 来源
    《Journal of Applied Physics》 |2010年第12期|p.124511.1-124511.4|共4页
  • 作者单位

    International Graduate School of Arts and Sciences, Yokohama City Universite, 22-2 Seto, Kanazawa-ku, Yokohama 236-0027, Japan;

    International Graduate School of Arts and Sciences, Yokohama City Universite, 22-2 Seto, Kanazawa-ku, Yokohama 236-0027, Japan;

    International Graduate School of Arts and Sciences, Yokohama City Universite, 22-2 Seto, Kanazawa-ku, Yokohama 236-0027, Japan;

    International Graduate School of Arts and Sciences, Yokohama City Universite, 22-2 Seto, Kanazawa-ku, Yokohama 236-0027, Japan;

    International Graduate School of Arts and Sciences, Yokohama City Universite, 22-2 Seto, Kanazawa-ku, Yokohama 236-0027, Japan;

    International Graduate School of Arts and Sciences, Yokohama City Universite, 22-2 Seto, Kanazawa-ku, Yokohama 236-0027, Japan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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