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首页> 外文期刊>Journal of Applied Physics >Thermal stability of high-reflectance La/B-based multilayers for 6.x nm wavelength
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Thermal stability of high-reflectance La/B-based multilayers for 6.x nm wavelength

机译:高反射率La / B多层膜在6.x nm波长下的热稳定性

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摘要

We have investigated the thermal stability of La/B-based (LaN/La/B) multilayer structures with partial-layer nitridation of La, a method shown earlier to result in enhanced reflectivity. The structures were annealed in the temperature range 100-500 °C for 70 h. They showed period drifts by 0.005 nm at 100 °C to 0.06 nm at 500 °C. A reflectivity loss of more than 2% was only observed after annealing above 300 °C. The study included separate investigation of B-on-LaN and LaN-on-La-on-B interfaces.
机译:我们已经研究了La / B基(LaN / La / B)多层结构的热稳定性,其中La的部分层氮化,这是一种较早显示的可提高反射率的方法。将结构在100-500°C的温度范围内退火70小时。他们显示了100°C时0.005 nm到500°C时0.06 nm的周期漂移。仅在高于300°C的退火条件下才观察到反射率损失超过2%。该研究包括对B-on-LaN和LaN-on-La-on-B接口的单独研究。

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  • 来源
    《Journal of Applied Physics》 |2017年第12期|125302.1-125302.7|共7页
  • 作者单位

    Industrial Focus Group XUV Optics, MESA+ Institute for Nanotechnology, University of Twente, P.O. Box 217, Enschede, Netherlands;

    Industrial Focus Group XUV Optics, MESA+ Institute for Nanotechnology, University of Twente, P.O. Box 217, Enschede, Netherlands;

    Industrial Focus Group XUV Optics, MESA+ Institute for Nanotechnology, University of Twente, P.O. Box 217, Enschede, Netherlands;

    Industrial Focus Group XUV Optics, MESA+ Institute for Nanotechnology, University of Twente, P.O. Box 217, Enschede, Netherlands;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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