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Temperature Dependence of Effective Grain Core/Single Crystal Dielectric Constants for Acceptor-Doped Oxygen Ion Conductors

机译:受体掺杂氧离子导体有效晶核/单晶介电常数的温度依赖性

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摘要

Effective grain core or single crystal dielectric constants of four solid oxide electrolytes-yttria-stabilized zirconia (YSZ with 8 and 7 mol% yttria), tetragonal zirconia polycrystals (TZP with 3 mol% yttria), strontium- and magnesium-doped lanthanum gallate (LSGM), and gadolinia-doped ceria (GDC, with 20 mol% gadolinia)-were studied as a function of temperature by AC-impedance spectroscopy and equivalent circuit fitting. Unlike their undoped counterparts, the acceptor-doped oxides consistently exhibited an upturn in effective grain core/single crystal dielectric constant in the vicinity of 350-500 K. This temperature-dependent behavior was attributed to the onset of thermally activated dipolar relaxation-an explanation supported by the appearance of loss tangent peaks at higher temperatures. Differences between "effective" dielectric constants and frequency-dependent complex dielectric constants for the grain core/single crystal frequency range, and applications of the effective dielectric constant data are discussed.
机译:四种固体氧化物电解质的稳定晶核或单晶介电常数-氧化钇稳定的氧化锆(氧化钇含量为8和7 mol%的YSZ),四方氧化锆多晶体(氧化钇含量为3 mol%的TZP),掺锶和镁的没食子酸镧(通过交流阻抗谱和等效电路拟合研究了LSGM)和掺杂氧化ado的二氧化铈(GDC,氧化g含量为20 mol%)。与未掺杂的氧化物不同,受主掺杂的氧化物始终在350-500 K附近表现出有效的晶核/单晶介电常数的上升。这种与温度有关的行为归因于热活化偶极弛豫的发生-一种解释在较高温度下出现损耗角正切峰的现象得到了支持。讨论了“有效”介电常数与晶核/单晶频率范围内随频率变化的复介电常数之间的差异,以及有效介电常数数据的应用。

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    Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208;

    Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208;

    Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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