首页> 外文期刊>Journal of the American Ceramic Society >Reply to the Comment on 'The Effect of Barium Substitution on the Ferroelectric Properties of Sr_2Nb_2O_7 Ceramics' [J. Am. Ceram. Soc, 96 [4] 1163-1170(2013)]
【24h】

Reply to the Comment on 'The Effect of Barium Substitution on the Ferroelectric Properties of Sr_2Nb_2O_7 Ceramics' [J. Am. Ceram. Soc, 96 [4] 1163-1170(2013)]

机译:对“钡替代对Sr_2Nb_2O_7陶瓷铁电性能的影响”的评论[J.上午。陶瓷Soc,96 [4] 1163-1170(2013)]

获取原文
获取原文并翻译 | 示例
           

摘要

In response to the comment that has been made on our results of X-ray photoelectron spectroscopy (XPS) analysis of the ferroelectric Sr_(2_x)Ba_xNb_2O_7 ceramics (0.1 ≤ x ≤ 0.5). XPS was used to explore the chemical state of the metal and oxygen ions in the solid solution samples. The results were collected at room temperature using an Escalab MKII, VG Scientific instrument (East Sussex, UK). A monochromatized AlKα (1486.5 eV) X-ray source was employed with a pass energy of 20 eV. The photoelectron energy drift due to charging effects was calibrated using Carbon 1s (285 eV) as a reference generated by adventitious carbon on the sample surface. The binding energy (BE) of certain electrons for each composition was used to compare and analyze the state of the ions. Different XPS experiments use different instruments and the value of C 1s, which is normally used as the reference to calibrate the data, are slightly different in different reports (284.6-285.2 eV). From the comment, the BE difference (ABE) method is proposed to analyze the results. The BE difference parameter is insensitive to the calibration method and the surface charging effects. Hence, it is particularly suitable for the comparative analysis of XPS results measured by different spectrometers.
机译:回应对我们对铁电Sr_(2_x)Ba_xNb_2O_7陶瓷(0.1≤x≤0.5)的X射线光电子能谱(XPS)分析结果发表的评论。 XPS用于探索固溶体样品中金属和氧离子的化学状态。使用Escalab MKII,VG Scientific仪器(英国东萨塞克斯郡)在室温下收集结果。使用单色化的AlKα(1486.5 eV)X射线源,其通过能量为20 eV。使用碳1s(285 eV)作为由样品表面上不定碳产生的参照物,校准了由于带电效应引起的光电子能量漂移。某些电子对每种成分的结合能(BE)用于比较和分析离子的状态。不同的XPS实验使用不同的仪器,并且通常用作校准数据参考的C 1s值在不同的报告中略有不同(284.6-285.2 eV)。从评论中,提出了BE差异(ABE)方法来分析结果。 BE差异参数对校准方法和表面电荷效应不敏感。因此,它特别适用于比较由不同光谱仪测得的XPS结果。

著录项

  • 来源
    《Journal of the American Ceramic Society》 |2014年第2期|662-663|共2页
  • 作者单位

    School of Engineering and Materials Science, Queen Mary University of London, London El 4NS, UK;

    School of Engineering and Applied Science, Aston University, Birmingham B4 7ET, UK;

    School of Engineering and Applied Science, Aston University, Birmingham B4 7ET, UK;

    School of Engineering and Materials Science, Queen Mary University of London, London El 4NS, UK,Nanoforce Technology Ltd, London El 4NS, UK;

    School of Engineering and Materials Science, Queen Mary University of London, London El 4NS, UK,Nanoforce Technology Ltd, London El 4NS, UK;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号