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首页> 外文期刊>Japanese journal of applied physics >Understanding of Initial Unstable Contact Behaviors of Au-to-Au Microcontact under Low Contact Force for Micro- and Nano-Electromechanical System Devices
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Understanding of Initial Unstable Contact Behaviors of Au-to-Au Microcontact under Low Contact Force for Micro- and Nano-Electromechanical System Devices

机译:了解微和纳米机电系统器件在低接触力下金对金微接触的初始不稳定接触行为

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摘要

The Au-to-Au microano-contact behavior in unstable contact region during the initial stage of contact formation has been experimentally investigated under low contact force. The experimental results reveal that the asperity deformation process, which is conventionally observed in the stable region, could start from the early stage of contact formation in the unstable region. The fundamental mechanism for the instability of electrical conductance in the unstable region can be explained under a framework of trap-assisted tunneling at the contact interface.
机译:已经在低接触力下通过实验研究了在接触形成的初始阶段中不稳定接触区域中的Au-Au-Au微/纳米接触行为。实验结果表明,通常在稳定区域中观察到的粗糙变形过程可以从不稳定区域中接触形成的早期阶段开始。可以在接触界面处陷阱辅助隧穿的框架下解释不稳定区域中电导不稳定的基本机理。

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  • 来源
    《Japanese journal of applied physics》 |2013年第9issue1期|090203.1-090203.4|共4页
  • 作者单位

    NOVITAS, Nanoelectronics Centre of Excellence School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore 639798, Republic of Singapore;

    NOVITAS, Nanoelectronics Centre of Excellence School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore 639798, Republic of Singapore;

    Temasek Laboratories at Nanyang Technological University, Research Techno Plaza, Singapore 637553, Republic of Singapore;

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