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首页> 外文期刊>Japanese journal of applied physics >Cavity Ring-Down Spectroscopy Measurement of H(n = 2) Density in Mesoplasma for Fast-Rate Silicon Epitaxy
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Cavity Ring-Down Spectroscopy Measurement of H(n = 2) Density in Mesoplasma for Fast-Rate Silicon Epitaxy

机译:腔衰荡光谱法测量速生硅外延中晶中H(n = 2)的密度

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摘要

The absolute density of the first excited state atomic hydrogen H(n = 2) in an Ar/H_2 mixture is measured in-situ by cavity ring-down spectroscopy under mesoplasma condition. The H(n = 2) atom density is determined to be in the range of 10~(10)-10~(11) cm~(-3) and the formation of H(n = 2) having such high density is identified to be predominantly due to the associative charge exchange/dissociative recombination reactions, similar to dc-arc plasma expanding into a low-pressure vessel that have been previously reported. The local H(n = 2) atom density is found to have a linear variation with deposition rate, which indicates that high H(n = 2) atom density have a direct role in the reduction of SiHCI_3 to Si.
机译:Ar / H_2混合物中的第一激发态原子氢H(n = 2)的绝对密度是通过介孔条件下的腔衰荡光谱原位测量的。确定H(n = 2)原子密度在10〜(10)-10〜(11)cm〜(-3)的范围内,并确定形成了具有这种高密度的H(n = 2)主要是由于缔合电荷交换/解离重组反应,类似于先前报道的直流电弧等离子体向低压容器扩展。发现局部H(n = 2)原子密度随沉积速率呈线性变化,这表明高H(n = 2)原子密度直接导致SiHCI_3还原为Si。

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  • 来源
    《Japanese journal of applied physics》 |2013年第7issue1期|071301.1-071301.5|共5页
  • 作者单位

    Department of Materials Engineering, The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan;

    Department of Materials Engineering, The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan;

    Department of Materials Engineering, The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan;

    Department of Materials Engineering, The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan;

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