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A promising CuO_x/WO_3 p-n heterojunction thin- film photocathode fabricated by magnetron reactive sputtering

机译:磁控反应溅射制备CuO_x / WO_3 p-n异质结薄膜光电阴极

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摘要

A CuOx/WO3 thin-film based on p-n heterojunction proposed as a highly performance and stable photocathode. The CuOx/WO3 thin-film was deposited by magnetron reactive sputtering layer by layer, followed with slow rate annealing in O-2 ambient. This is an excellent method for high-quality and uniform composite thin-film deposition with large areas at a high growth rate. The optimized CuOx/WO3 thin-film photocathode after slow rate annealing at 500 degrees C in O-2 provides an obviously enhanced photoinduced current density of -3.8 mA cm(-2) at a bias potential of -0.5 V (vs. Ag/AgCl), which value is 1.5 times higher than that of bared CuOx thin-film. This highly enhanced photoelectrochemical performance is attributed to p-n heterojunction, which accelerates the photogenerated electrons and holes transfer to n-WO3 and p-CuOx, thereby accelerate the separation of photogenerated carries. In addition, WO3 layer covered on the surface of CuOx thin film can improve the stability of Cu2O in electrolytes. (C) 2018 Hydrogen Energy Publications LLC. Published by Elsevier Ltd. All rights reserved.
机译:基于p-n异质结的CuOx / WO3薄膜被认为是高性能和稳定的光电阴极。通过磁控反应溅射逐层沉积CuOx / WO3薄膜,然后在O-2环境中进行慢速退火。这是一种用于大面积,高生长速率的高质量,均匀复合薄膜沉积的极好方法。经过优化的CuOx / WO3薄膜光电阴极在O-2中在500摄氏度下进行慢速退火后,在-0.5 V(vs. Ag / v)的偏压下,显着增强了-3.8 mA cm(-2)的光致电流密度。 AgCl),其值是裸露的CuOx薄膜的1.5倍。这种高度增强的光电化学性能归因于p-n异质结,它加速了光生电子和空穴向n-WO3和p-CuOx的转移,从而加速了光生载流子的分离。另外,覆盖在CuOx薄膜表面上的WO3层可以提高电解质中Cu2O的稳定性。 (C)2018氢能出版物有限公司。由Elsevier Ltd.出版。保留所有权利。

著录项

  • 来源
    《International journal of hydrogen energy》 |2019年第8期|4062-4071|共10页
  • 作者单位

    Tokushima Univ, Inst Sci & Technol, 2-1 Minami Josanjima, Tokushima 7708506, Japan;

    Anan Coll, Natl Inst Technol, 265 Aoki Minobayashi, Anan, Tokushima 7740017, Japan;

    Tokushima Univ, Inst Sci & Technol, 2-1 Minami Josanjima, Tokushima 7708506, Japan;

    Tokushima Univ, Inst Sci & Technol, 2-1 Minami Josanjima, Tokushima 7708506, Japan;

    Tokushima Univ, Inst Sci & Technol, 2-1 Minami Josanjima, Tokushima 7708506, Japan;

    Xidian Univ, Key Lab Wide Band Gap Semicond Mat & Devices, Sch Microelect, Xian 710071, Peoples R China;

    Tokushima Univ, Inst Sci & Technol, 2-1 Minami Josanjima, Tokushima 7708506, Japan|Xidian Univ, Key Lab Wide Band Gap Semicond Mat & Devices, Sch Microelect, Xian 710071, Peoples R China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    p-n heterojunction; Copper oxide; Tungsten oxide; Photoelectrochemical; Magnetron reactive sputtering;

    机译:p-n异质结铜氧化物钨氧化物光电化学磁控反应溅射;

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