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An MTJ-based non-volatile flip-flop for high-performance SoC

机译:基于MTJ的非易失性触发器,用于高性能SoC

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摘要

The conventional magnetic tunneling junction (MTJ)-based non-volatile D flip-flop (NVDFF) has a slow D-Q delay and a tradeoff between its D-Q delay and its sensing current. In addition, a sufficient write current cannot be obtained with the core device, since two MTJs exist in the write path and a write current degradation problem occurs due to the precharge transistors. The proposed MTJ-based non-volatile semidynamic flip-flop (NVSDFF) has a semidynamic structure that ensures a fast D-Q delay and separates the sensing circuit from the D-Q signal path to reduce the sensing current without affecting the D-Q delay. The proposed NVSDFF also provides a sufficient write current by merely using the core device, since only one MTJ exists in the write path. In addition, the head switch, which is added to remove the write current degradation problem, further reduces the sensing current. Thus, the proposed NVSDFF has a higher read disturbance margin than the previous NVDFF with an IO device. The HSPICE simulation results with the industry-compatible 45 nm model parameter show that the D-Q delay in the proposed NVSDFF is 50.5% of that of the previous NVDFF with an IO device, and the sensing current, 32.3%. In the proposed NVSDFF, the read disturbance margin is 15.9% larger than in the previous NVDFF with an IO device, and the area is 17.8% smaller.
机译:传统的基于磁性隧道结(MTJ)的非易失性D触发器(NVDFF)具有较慢的D-Q延迟,并且需要在其D-Q延迟与感测电流之间进行权衡。另外,由于在写入路径中存在两个MTJ,并且由于预充电晶体管而引起写入电流劣化问题,因此核心设备不能获得足够的写入电流。所提出的基于MTJ的非易失性半动态触发器(NVSDFF)具有半动态结构,可确保快速的D-Q延迟,并将感测电路与D-Q信号路径分开,以减小感测电流,而不会影响D-Q延迟。由于在写入路径中仅存在一个MTJ,因此所提出的NVSDFF也仅通过使用核心设备即可提供足够的写入电流。此外,为消除写电流劣化问题而添加的磁头开关进一步减小了感测电流。因此,与使用IO设备的先前NVDFF相比,建议的NVSDFF具有更高的读取干扰余量。具有行业兼容的45 nm模型参数的HSPICE仿真结果表明,所提出的NVSDFF中的D-Q延迟是使用IO设备的先前NVDFF的D-Q延迟的50.5%,感测电流为32.3%。在拟议的NVSDFF中,读取干扰余量比使用IO设备的先前NVDFF大15.9%,并且面积减小了17.8%。

著录项

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  • 作者单位

    Yonsei University, School of Electrical and Electronic Engineering, 134 Shinchon-dong, Seodaemun-gu, Seoul, 120-749, Korea;

    Yonsei University, School of Electrical and Electronic Engineering, 134 Shinchon-dong, Seodaemun-gu, Seoul, 120-749, Korea;

    Yonsei University, School of Electrical and Electronic Engineering, 134 Shinchon-dong, Seodaemun-gu, Seoul, 120-749, Korea;

    Qualcomm Incorporated, 5775 Morehouse Drive, San Diego, California 92121-1714, U.S.A.;

    Qualcomm Incorporated, 5775 Morehouse Drive, San Diego, California 92121-1714, U.S.A.;

    Yonsei University, School of Electrical and Electronic Engineering, 134 Shinchon-dong, Seodaemun-gu, Seoul, 120-749, Korea;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《化学文摘》(CA);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    MTJ; spintronics logic; retention flip-flop; non-volatile; high-performance; low sensing current and write current;

    机译:MTJ;自旋电子学逻辑;保留触发器非易失性高性能低感测电流和写入电流;

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