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Ultrasound lock-in thermography for advanced depth resolved defect selective imaging

机译:超声锁定热成像技术,用于深度深度分辨缺陷选择性成像

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摘要

Ultrasound lock-in thermography ('attenuation mapping') is a defect selective 'dark field' NDT technique with a high probability of defect detection (PoD), since only defects produce a signal while other features are suppressed. The basic contrast mechanism is the enhanced local mechanical loss turning a variably loaded defect into a heat source. The method is being applied for quality maintenance, for example in the aerospace and automotive industry to monitor the integrity of thermal features. A variety of examples will be presented to illustrate how well the method is suited to locate defects and to distinguish their depths.
机译:超声锁定热成像技术(“衰减映射”)是一种缺陷选择“暗场” NDT技术,具有很高的缺陷检测率(PoD),因为只有缺陷会产生信号,而其他特征却被抑制。基本的对比机制是增强的局部机械损耗,将可变负载的缺陷转化为热源。该方法正用于质量维护,例如在航空航天和汽车工业中,以监视热特征的完整性。将提供各种示例,以说明该方法如何很好地定位缺陷并区分其深度。

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