Two Test Generation Methods Using a Compacted Test Table and a Compacted Test Plan Table for RTL Data Path Circuits

摘要

This paper proposes a test generation method using a compacted test table and a test generation method using a compacted test plan table for RTL data path circuits with DFT where hierarchical test generations are applicable. Moreover, a heuristic algorithm for a compacted test plan table generation is proposed. The proposed methods could shorten test lengths for some RTL data path circuits compared with the conventional hierarchical test generation method.