首页> 外文期刊>IEICE Transactions on Information and Systems >A Leakage Efficient Instruction TLB Design for Embedded Processors
【24h】

A Leakage Efficient Instruction TLB Design for Embedded Processors

机译:嵌入式处理器的高效泄漏指令TLB设计

获取原文
获取原文并翻译 | 示例
           

摘要

This paper presents a leakage-efficient instruction TLB (Translation Lookaside Buffer) design for embedded processors. The key observation is that when programs enter a physical page, the following instructions tend to be fetched from the same page for a rather long time. Thus, by employing a small storage component which holds the recent address-translation information, the TLB access frequency can be drastically decreased, and the instruction TLB can be turned into the low-leakage mode with the dual voltage supply technique. Based on such a design philosophy, three leakage control policies are proposed to maximize the leakage reduction efficiency. Evaluation results with eight MiBench programs show that the proposed design can reduce the leakage power of the instruction TLB by 50% on average, with only 0.01% performance degradation.
机译:本文提出了一种用于嵌入式处理器的泄漏有效指令TLB(转换后备缓冲器)设计。关键的观察是,当程序进入物理页面时,以下指令往往会在相当长的时间内从同一页面中获取。因此,通过采用保持最近的地址转换信息的小型存储部件,可以大幅度降低TLB的访问频率,并且可以通过双电压供给技术将指令TLB转换为低泄漏模式。基于这种设计理念,提出了三种泄漏控制策略,以最大程度地减少泄漏。八个MiBench程序的评估结果表明,所提出的设计可将指令TLB的泄漏功率平均降低50%,而性能仅下降0.01%。

著录项

  • 来源
    《IEICE Transactions on Information and Systems》 |2011年第8期|p.1565-1574|共10页
  • 作者单位

    The authors are with the Faculty of Science and Technology, Keio University, Yokohama-shi, 223-0061 Japan.;

    The authors are with the Faculty of Science and Technology, Keio University, Yokohama-shi, 223-0061 Japan.;

    The authors are with the Faculty of Science and Technology, Keio University, Yokohama-shi, 223-0061 Japan.;

    The authors are with the Department of Computer and Information Sciences, Tokyo University of Agriculture and Technology, Koganei-shi, 184-8588 Japan;

    The authors are with the Department of Computer and Information Sciences, Tokyo University of Agriculture and Technology, Koganei-shi, 184-8588 Japan;

    The authors are with the Faculty of Science and Technology, Keio University, Yokohama-shi, 223-0061 Japan.;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    leakage power; TLB; embedded processor;

    机译:泄漏功率TLB;嵌入式处理器;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号