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Electrothermal simulation of an IGBT PWM inverter

机译:IGBT PWM逆变器的电热仿真

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摘要

An electrothermal network simulation methodology is used to analyze the behavior of a full-bridge, pulse-width-modulated (PWM), voltage-source inverter, which uses insulated gate bipolar transistors (IGBTs) as the switching devices. The electrothermal simulations are performed using the Saber circuit simulator and include control logic circuitry, IGBT gate drivers, the physics-based IGBT electrothermal model, and thermal network component models for the power-device silicon chips, packages, and heat sinks. It is shown that the thermal response of the silicon chip determines the IGBT temperature rise during the device switching cycle. The thermal response of the device TO247 package and silicon chip determines the device temperature rise during a single phase of the 60-Hz sinusoidal output. Also, the thermal response of the heat sink determines the device temperature rise during the system startup and after load-impedance changes. It is also shown that the full electrothermal analysis is required to accurately describe the power losses and circuit efficiency.
机译:电热网络仿真方法用于分析全桥,脉宽调制(PWM)电压源逆变器的性能,该逆变器使用绝缘栅双极晶体管(IGBT)作为开关器件。电热仿真是使用Saber电路模拟器执行的,包括控制逻辑电路,IGBT栅极驱动器,基于物理的IGBT电热模型以及功率器件硅芯片,封装和散热器的热网络组件模型。结果表明,硅芯片的热响应决定了器件开关周期中IGBT的温度上升。器件TO247封装和硅芯片的热响应决定了60Hz正弦输出单相期间器件的温度上升。同样,散热器的热响应决定了系统启动期间以及负载阻抗改变后设备的温度升高。还表明,需要完整的电热分析来准确描述功率损耗和电路效率。

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