首页> 外文期刊>IEEE Transactions on Microwave Theory and Techniques >Design of a 60-GHz High-Output Power Stacked- FET Power Amplifier Using Transformer-Based Voltage-Type Power Combining in 65-nm CMOS
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Design of a 60-GHz High-Output Power Stacked- FET Power Amplifier Using Transformer-Based Voltage-Type Power Combining in 65-nm CMOS

机译:利用基于电压的65nm CMOS电压组合功率的60GHz高输出功率堆叠FET功率放大器的设计

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In this paper, a 60-GHz transformer (TF)-based voltage-type-combined single-stage stacked field-effect transistor (FET) power amplifier (PA) is demonstrated using a 65-nm CMOS process. A stacked-FET structure is adopted in the PA design to overcome the low breakdown voltage limit of MOSFETs. The TF-based voltage-type combiner used in the design has 0.9-dB insertion loss with a compact size of 0.023 mm2. The additional output balun is utilized to transform the differential output of the voltage-type combiner to the single-ended output for testing consideration. The thermal problem of the PA was discovered and improved during measurement. With a 3-V supply, the measured PA achieves the saturated output power (PSAT) of 21.8 dBm, the maximum power-added efficiency (PAEmax) of 12.4%, and a 8.7-dB small-signal gain (|S21|) at 60 GHz with the loss of the output balun. Without considering the loss of the output balun, which is 0.825 dB, the measured PA achieves PSAT of 22.8 dBm, the PAEmaxof 15.9%, and a 9.5-dB gain at 60 GHz.
机译:本文使用65 nm CMOS工艺演示了基于60 GHz变压器(TF)的电压型组合单级堆叠场效应晶体管(FET)功率放大器(PA)。 PA设计中采用了堆叠式FET结构,以克服MOSFET的低击穿电压限制。设计中使用的基于TF的电压型组合器具有0.9dB的插入损耗,紧凑尺寸为0.023 mm n 2 n。额外的输出巴伦用于将电压型组合器的差分输出转换为单端输出,以进行测试。在测量过程中发现并改善了PA的热问题。使用3 V电源时,测得的PA达到饱和输出功率(P n SAT),即21.8 dBm,最大功率附加效率(PAE n max n)为12.4% 8.7 dB小信号增益(| S n 21 n |)在60 GHz时会丢失输出巴伦。不考虑输出巴伦的损耗(0.825 dB),测得的PA达到22.8 dBm的PSAT,PAE n max n为15.9%,在60 GHz时增益为9.5dB。

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