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Tribological and Dynamic Study of Head Disk Interface at Sub-1-nm Clearance

机译:1纳米以下间隙的磁头磁盘接口的摩擦学和动态研究

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As the areal recording density approaches to 1 Tb/in $^{2}$, the spacing between magnetic heads and medium is decreased to sub-1-nm regime with the application of dynamic flying height (DFH) technology. Challenges in tribological flyability and reliability in the head-disk interface (HDI) become formidable at such ultra-low spacing, and it is necessary to achieve from both media and head design. It is also essential to have a better touch-down (TD) detection method and more accurate back-off spacing control for sustainable tribological performances. In this paper, the dynamics and wear during TD process were studied first. The characteristic TD modes were identified by laser Doppler vibrometry (LDV) and the TD induced wear was quantified using scanning electron microscopy (SEM) and atomic force microscopy (AFM). The results show that different TD stages correspond to different TD modes and amount of TD wear. It is found that the identification and capture of the characteristic TD modes, especially the first TD mode, are the key factors to timely detect TD and minimize the TD wear. The tribological performances at sub-1-nm clearance were then investigated with respect to both head and media design. The slider dynamics over a bump was studied to simulate the head reliability when the head intermittently contacts the media. It is found that air bearing surface (ABS) design of the head has a significant influence on the settling time when head passes through the bump. In addition, the flyability over a wavy surface (i.e., media run-out) was also studied to understand the TD repeatability. The results show that media run-out strongly affects TD repeatability and back-off spacing accuracy. Consequently, spacing control to sustain the reliability at sub-1-nm clearance is necessary. With in-depth understanding of dynamics and tribological performances (i.e., flyability and reliability), media and head ABS des-n-nign are the key factors to achieve a sustainable HDI at sub-1-nm clearance.
机译:随着面记录密度接近1 Tb / in $ ^ {2} $,通过使用动态飞行高度(DFH)技术,磁头和介质之间的间距减小到1 nm以下。在这样的超低间距下,磁头-磁盘接口(HDI)的摩擦飞行性和可靠性方面的挑战变得非常艰巨,并且有必要从介质和磁头设计中实现这一点。拥有更好的接地(TD)检测方法和更精确的退避间距控制对于可持续的摩擦性能也至关重要。本文首先对TD过程中的动力学和磨损进行了研究。通过激光多普勒振动法(LDV)识别特征TD模式,并使用扫描电子显微镜(SEM)和原子力显微镜(AFM)量化TD引起的磨损。结果表明,不同的TD阶段对应于不同的TD模式和TD磨损量。发现,特征TD模式(尤其是第一个TD模式)的识别和捕获是及时检测TD并使TD磨损最小化的关键因素。然后针对磁头和介质设计研究了低于1 nm间隙的摩擦学性能。研究了凸点上的滑块动力学,以模拟磁头间歇性接触介质时的磁头可靠性。发现头部的空气轴承表面(ABS)设计对头部经过凸块时的稳定时间有很大影响。此外,还研究了在波浪表面上的可飞行性(即介质跳动),以了解TD的可重复性。结果表明,介质用尽严重影响TD的可重复性和退避间隔的准确性。因此,必须进行间距控制以维持低于1 nm的间隙的可靠性。通过深入了解动力学和摩擦学性能(即可飞行性和可靠性),介质和头部ABS的设计是实现低于1 nm间隙的可持续HDI的关键因素。

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