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Electronic noise in Ba/sub 2/YCu/sub 3/O/sub 7/ films at high temperatures: a possible connection to stress relaxation

机译:高温下Ba / sub 2 / YCu / sub 3 / O / sub 7 /薄膜中的电子噪声:可能与应力松弛有关

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摘要

Two types of electronic noise have been observed in Ba/sub 2/YCu/sub 3/O/sub 7/ at high temperature. One type is probably due to temperature and pressure fluctuations in the environment of the sample. Because of the known sensitivity of Ba/sub 2/YCu/sub 3/O/sub 7/ resistance to both temperature and pressure, this mechanism translates into 10 to 100 nV per root Hz of noise at temperatures above 750 K. The second type is more intrinsic, and may be related to stress relaxation in the film induced by the structural changes associated with the orthorhombic-tetragonal transition near 950 K.
机译:在高温下,Ba / sub 2 / YCu / sub 3 / O / sub 7 /中观察到两种电子噪声。一种类型可能是由于样品环境中的温度和压力波动所致。由于已知Ba / sub 2 / YCu / sub 3 / O / sub 7 /对温度和压力的敏感性,因此该机制在温度超过750 K时,每根Hz噪声转化为10至100 nV。是更固有的,并且可能与薄膜的应力松弛有关,该应力松弛是由与950 K附近的正交-四边形转变相关的结构变化引起的。

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