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Investigation of Microscopic Demagnetization Process Using Magneto-Optical Microscopy

机译:磁光显微镜对微观退磁过程的研究

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Detailed demagnetization process depending on various external field profiles has been investigated using a magneto-optical Kerr/Faraday microscopy for a Co/Pt multilayer film with a perpendicular magnetic anisotropy. By quantitatively analyzing local magnetic domain structures, we propose that it is possible to define a parameter $eta$ , which represents how well the demagnetization has been carried out microscopically. The degree of demagnetization $eta$ , defined by a ratio between the final demagnetized image intensity and saturated image intensity, has been experimentally found to significantly reflect the microscopic demagnetization behavior. Dependences of $eta$ on the maximum amplitude, decreased step size, and effective sweeping rate of alternating demagnetizing field have been systematically investigated together with a direct microscopic observation of magnetic domain structures.
机译:对于具有垂直磁各向异性的Co / Pt多层膜,已经使用磁光Kerr /法拉第显微镜研究了取决于各种外部场分布的详细退磁过程。通过定量分析局部磁畴结构,我们建议可以定义一个参数$ eta $,该参数表示退磁的微观效果。已经通过实验发现由最终退磁图像强度和饱和图像强度之间的比率定义的退磁度ηeta$显着反映了微观退磁行为。系统地研究了$ eta $对最大振幅,减小的步长和交变去磁场的有效扫掠速率的依赖性,以及对磁畴结构的直接显微镜观察。

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