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Performance Evaluation of Silicon Photomultipliers for Frequency-Domain Fluorescence Lifetime Measurement Based on a Comprehensive Circuit Model

机译:基于综合电路模型的用于频域荧光寿命测量的硅光电倍增管性能评估

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摘要

The presented models for silicon photomultiplier (SiPM) detectors in literature have been mainly used to study fast light pulses. In this paper, a comprehensive dynamic model is proposed to investigate the output signal of a SiPM exposed to intensity-modulated lights (with sine-wave modulation). A procedure is also proposed to simulate this model. Using the proposed model, the SiPM behavior is examined under various frequencies and intensities of lights in simulation. Then, fluorescence lifetime (FLT) measurement in the frequency domain is discussed. Finally, the simulation results are compared with the experimental results which are extracted from an experiment set up employing two SiPMs exposed by excitation and emission lights.
机译:文献中提出的硅光电倍增管(SiPM)检测器模型已主要用于研究快速光脉冲。在本文中,提出了一个综合的动力学模型来研究暴露在强度调制光(带正弦波调制)下的SiPM的输出信号。还提出了模拟该模型的程序。使用提出的模型,可以在模拟的各种频率和光强度下检查SiPM行为。然后,讨论了频域中的荧光寿命(FLT)测量。最后,将模拟结果与实验结果进行比较,实验结果是从使用两个受激发和发射光照射的SiPM的实验装置中提取的。

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