Multiple fault diagnosis in analogue circuits using time domain response features and multilayer perceptrons

摘要

A technique is described for diagnosing multiple faults in analogue circuits from their impulse response function using multilayer perceptrons, in terms of a specific example. A Dirac impulse input to the circuit was simulated, and time domain features of the output response were classified by a system of two multilayer perceptrons to produce accurate numerical fault values.