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首页> 外文期刊>IEE proceedings. Part G, Circuits, devices and systems >Design and analysis of a 0.6 V-operating merged CMOS-bipolar SRAMcell
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Design and analysis of a 0.6 V-operating merged CMOS-bipolar SRAMcell

机译:工作于0.6 V的合并式CMOS双极SRAMcell的设计与分析

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A novel CMOS-bipolar SRAM cell has been analysed for a supplynvoltage of 0.6 V. It incorporates cross-coupled CMOS and complementarynbipolar inverters with two NMOS access transistors. Standard double-endnwrite operation with single-end read operation from the bipolar node isndiscussed. A column circuitry to accompany the cell is also proposed.nSimulation results using a standard 1.5 Μm CMOS technology show annaccess time of 5-7 ns with very low standby and active power dissipationnof 18 nW/bit and 2.2 ΜW/bit, respectively. The cell area is found tonbe less than that of the corresponding full-CMOS SRAM cell
机译:分析了新型CMOS双极SRAM单元的电源电压为0.6V。该单元将交叉耦合的CMOS和互补双极反相器与两个NMOS存取晶体管结合在一起。讨论了从双极节点进行单端读取操作的标准双端写入操作。还提出了一种与该单元相伴的列电路。n使用标准的1.5μmCMOS技术的仿真结果显示,访问时间为5-7 ns,待机和有功功耗非常低,分别为18 nW / bit和2.2 MW / bit。发现单元面积小于相应的全CMOS SRAM单元的面积

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