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Helium irradiation effects for deuterium retention in boron coating films

机译:氦气辐照对硼涂层膜中氘的保留

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TDS analyses have been performed in order to examine helium irradiation effects for deuterium retention in boron coating films prepared by PACVD. It is clarified that the deuterium retention is reduced due to the irradiation prior to deuterium. There is no correlation between the retention variations of deuterium and helium, and thus the helium occupation seems hardly to contribute to the reduction. The third peaks in the TDS spectra shift on the high temperature side with the irradiation fluence. It is presumed that helium irradiation forms certain layers by knocking on boron atoms, in which deuterium retention is partly restricted, and trapped deuterium needs higher energy for the desorption.
机译:为了检查氦辐照作用对通过PACVD制备的硼涂层膜中的氘保留,进行了TDS分析。明确的是,氘的保留由于在氘之前的照射而降低。氘和氦气的保留变化之间没有相关性,因此氦气的吸收似乎几乎无助于减少。 TDS光谱中的第三个峰随着辐照量而在高温侧移动。据推测,氦辐射通过敲击硼原子而形成某些层,其中氘的保留受到部分限制,并且被俘获的氘需要更高的能量来进行解吸。

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