Dielectric Spectroscopy of Pressurized Saccharomyces cerevisiae

摘要

Results of broadband dielectric spectroscopy (BDS) in Saccharomyces cerevisiae (baker's yeast), in situ as the function of pressure are presented. They show a clear evidence of a threshold to the new pattern of the pressure evolution of the static dielectric permittivity and DC electric conductivity already for P (t) a parts per thousand aEuro parts per thousand 200MPa at T = 5 (o) C and P (t) a parts per thousand aEuro parts per thousand 300MPa at T = 25 (o) C. BDS monitoring versus pressure tests up to P = 400MPa revealed particularly notable changes of properties after 30 minutes of compressing. Finally, the correlation between the amount of the spectrophotometric maximum absorbance and the DC electric conductivity was found. All these indicate significance of BDS as the tool for testing of pressure properties of cells assemblies, model foods etc., in situ under high pressures.