ATE for ASSPs

摘要

The Diamondx Semiconductor Test System targets ASSPs and complex microcontrollers in wireless and mobility applications as well as consumer ICs. The system offers a universal instrument slot architecture, allowing easy scaling from single-site to multisite, from digital only to mixed-signal to RF ASSP configurations. Its small footprint makes it suitable for lab development and high-volume production. A PCI-Express2 Data Bus supports up to 80-Gb/s bidirectional transfer between the system CPU and the test head.