ITC focuses on automotive, data analytics

摘要

The International Test Conference was held Oct. 29-Nov. 3, 2017, in Fort Worth, TX. The week included three days of exhibits and technical presentations bracketed by tutorials and workshops. A key emphasis was on automotive, followed by data analytics. Board- and system-level test was the focus of a Monday tutorial. Krishnendu (Krish) Chakrabarty described board- and system-level test challenges and why chips that pass ATE test can fail in boards and systems, and it proposed machine-learning techniques to address the challenges.