Agilent is very proud that the 41 56C has proven its usefulness to our customers for over five years. The 4156C provides a complete solution for the characterization and analysis of semiconductor devices. The 41 56C comes standard with four source/monitor units (SMUs), two voltage monitor units (VMUs), and two voltage source units (VSUs). These standard resources satisfy the vast majority of characterization needs. Additional measurement resources (more SMUs and pulse generator units) can easily be added. Agilent I/CV 3.0 Lite enables the utilization of all instrument measurement capabilities through a graphical interface in Microsoft(r) Windows 2000 or XP Professional environments. I/CV 3.0 Lite displays the device under test (DUT) as a graphical schematic, making parametric test intuitive and easy. I/CV 3.0 Lite also offers wafer prober control, test sequencing, and data analysis capabilities to create a complete solution for parametric measurement and analysis.
展开▼
