An Internal Pattern Run-Length Methodology for Slice Encoding

摘要

A simple and effective compression method is proposed for multiple-scan testing. For a given test set, each test pattern is compressed from the view of slices. An encoding table exploiting seven types of frequently-occurring pattern is used. Compression is then achieved by mapping slice data into codewords. The decompression logic is small and easy to implement. It is also applicable to schemes adopting a single-scan chain. Experimental results show this method can achieve good compression effect