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Highly Resilient Fault-Tolerant Topology of Single-Phase Multilevel Inverter

机译:单相多级逆变器的高弹性容错拓扑

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摘要

The high failure rate of semiconductor devices and capacitors, matched with their high requirement in the architecture of a multilevel inverter (MLI) topology, results in low reliability of the inverter. A low device count, preserving the output power upon fault occurrence and the ability to tolerate both open- and short-switch failures on all fault locations, handling both single- and multiple-switch failures, and achieving natural voltage balancing of the capacitors, are the main challenges for the existing solutions to the fault-tolerant topologies. Thus, a highly resilient fault-tolerant topology, based on conventional inverters, is proposed in this article. The proposed solution accomplishes all the aforementioned challenges without deteriorating the efficiency of the inverter during faulty conditions. The robustness and effectiveness of the proposed topology are verified by the obtained experimental results. Multiple cases of switch failure are considered to cover all fault locations and types. Comparative analysis with the recently proposed fault-tolerant topologies on MLIs shows the superiority of the proposed topology over the rest.
机译:半导体器件和电容器的高故障率与它们在多级逆变器(MLI)拓扑结构的架构中的高要求匹配导致逆变器的可靠性降低。低电平设备计数,在故障发生时保留输出功率以及容忍所有故障位置上的开放和短路故障的能力,处理单个和多个开关故障以及实现电容器的自然电压平衡现有解决方案对容错拓扑解决方案的主要挑战。因此,本文提出了基于传统逆变器的高度弹性容错拓扑。所提出的解决方案实现了所有上述挑战,而不会在故障条件下恶化逆变器的效率。所得实验结果验证了所提出的拓扑的鲁棒性和有效性。多个开关故障案例被认为是覆盖所有故障位置和类型。比较分析与MLIS上最近提出的容错拓扑显示出休息的拓扑结构的优势。

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