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首页> 外文期刊>IEEE Transactions on Electron Devices >Simulation-Based Study About the Lifetime and Incident Light Properties Dependence of the Optically Triggered 4H-SiC Thyristors Operation
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Simulation-Based Study About the Lifetime and Incident Light Properties Dependence of the Optically Triggered 4H-SiC Thyristors Operation

机译:基于光学的4H-SiC晶闸管工作寿命和入射光特性相关性的研究

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摘要

We investigated a methodology to design light-triggered thyristors thanks to TCAD. The simulation model accuracy, especially the holding current and the minimum incident light intensity to turn-ON, were compared with experimental results. The influence of SiC epitaxial layer lifetime and the incident light properties (wavelength and intensity) on the optically triggered 4H-SiC thyristor characteristics have been studied by simulation. We considered the wavelength dependence of quantum efficiency, penetration depth, and photon energy. The holding current and turn-ON time depends on the lifetime. The minimum intensity to turn-ON the device significantly depends on the wavelength. This intensity becomes less than 0.003 times when the wavelength changed from 380 to 325 nm. In addition, the breakover voltage is affected by the constant incident light even if the intensity is tiny.
机译:由于采用了TCAD,我们研究了一种设计光触发晶闸管的方法。将仿真模型的精度,特别是保持电流和打开的最小入射光强度与实验结果进行了比较。通过仿真研究了SiC外延层寿命和入射光特性(波长和强度)对光触发4H-SiC晶闸管特性的影响。我们考虑了量子效率,穿透深度和光子能量的波长依赖性。保持电流和接通时间取决于寿命。打开设备的最小强度在很大程度上取决于波长。当波长从380 nm变为325 nm时,此强度小于0.003倍。另外,即使强度很小,击穿电压也会受到恒定入射光的影响。

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