Power-supply interrupter fights ESD-induced device latch-up

摘要

Under certain conditions, ESD events can damage digital circuits by causing latch-up. For example, when ESD triggers them, parasitic transistors normally formed as parts of a CMOS device can behave as an SCR (silicon-controlled rectifier). Once ESD triggers, the SCR presents a low-resistance path between portions of the CMOS device and conducts heavily. Damage to the device can result unless you immediately remove power from the circuit. ESD from human interaction presents a significant problem for mobile industrial and medical devices. For adequate ESD protection, most medical and industrial devices require a grounded return path for ESD currents. In the real world, mobile devices may serve in environments in which properly grounded power outlets are unavailable.