HELPING CHIP DESIGN AND PROCESS DEVELOPMENT MOVE FORWARD

摘要

Sun answered quickly. "The primary problem today, as we take 40 nm into production, is variability," he says. "There is only so much the process engineers can do to reduce process-based variations in critical quantities. We can characterize the variations, and, in fact, we have very good models today. But they are time-consuming models to use. So, most of our customers still don't use statistical-design techniques. That means, unavoidably, that we must leave some performance on the table."