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Low Electron Temperature Plasma Diagnosis: Revisiting Langmuir Electrostatic Probes

机译:低电子温度等离子体诊断:重新探测朗马尔静电探头

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This article describes a method of measurement of the current-to-probe voltage characteristic curve of a Langmuir electrostatic probe immersed in a plasma characterized by a low electron temperature that is only one order of magnitude higher than room temperature. These plasmas are widely used in industrial processes related to surface technology, polymers, cleaning, nanostructures, etc. The measurement method complies with the strict requirements to perform representative plasma diagnosis, particularly in the ion saturation zone when the probe is polarized much more negatively that the potential of the plasma bulk surrounding the probe and allows to diagnose the plasma very quickly and locally, making it possible to better monitor and control the plasma discharge uniformity and time drift. The requirements for the Langmuir probe design, the data acquisition and data treatment are thoroughly explained and their influence on the measurement method is also described. Subsequently, the article describes different diagnostic methods of the magnitudes that characterize the plasma, based on theoretical models of that characteristic curve. Each of these methods is applied to different zones of the measured characteristic curve, the obtained results being quite similar, which guarantees the quality of the measurements. The advantages and disadvantages of each method are discussed. A series of measurements of the plasma density for different plasma conditions shows that the method is sensitive enough that the temperature of the ions needs to be taken into account in the data processing. Finally, a Virtual Instrument is included in the LabView environment that performs the diagnosis process with sufficient speed and precision, which allows the scientist to control the parameters that characterize the plasma to increase the quality and performance of the industrial processes in which the plasma diagnosis is to be used. The Virtual Instrument can be downloaded for free from a link that is included, in order to be easily adapted to the usual devices in a plasma laboratory.
机译:本文介绍了一种测量浸入血浆静电探针的电流探针电压特性曲线的方法,其特征在于低电子温度,该阶体积高于室温。这些等离子体广泛应用于与表面技术,聚合物,清洁,纳米结构等相关的工业过程中。测量方法符合严格的要求,以进行代表性血浆诊断,特别是当探针被偏振时的离子饱和区内探头围绕血浆块的潜力,并且允许非常快速地局部诊断等离子体,使得可以更好地监测并控制等离子体放电均匀性和时间漂移。对Langmuir探测设计,数据采集和数据处理的要求得到了彻底解释,并且还描述了对测量方法的影响。随后,本文介绍了基于该特征曲线的理论模型表征等离子体的幅度的不同诊断方法。这些方法中的每一个应用于测量特性曲线的不同区域,所获得的结果非常相似,这保证了测量的质量。讨论了每种方法的优点和缺点。对于不同等离子体条件的等离子体密度的一系列测量结果表明,该方法足够敏感,以至于在数据处理中需要考虑离子的温度。最后,虚拟仪器包含在LabVIEW环境中,以足够的速度和精度执行诊断过程,这使得科学家可以控制表征等离子体的参数,以提高等离子体诊断的工业过程的质量和性能要使用的。可以从包含的链接中免费下载虚拟仪器,以便轻松适应等离子体实验室中的常用设备。

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