Research on the combination of improved Sobel operator and ant colony algorithm for defect detection

摘要

There are many aspects in the defect detection system. Any deviation in any link will affect the accuracy of the final detection, and edge detection is very important in the image preprocessing stage. In this paper, a new edge detection algorithm is proposed. Firstly, the improved Sobel operator is used to detect the image contour, and then the position of the contour is taken as the initial position of ant colony algorithm. The experimental results show that the algorithm can extract the contour with uniform thickness and length from the original image collected by the industrial camera, and the running time of the algorithm is almost the same as that of the traditional ant colony algorithm, thus providing more accurate data for the defect detection of products in the later stage.