This paper demonstrates a novel technique basedon the use of a fuzzy logic system and the simulation before test(SBT) approach for hard faults detection and localization in an-alog electronic circuits comprising bipolar transistors. For thispurpose, first, simulations of the circuit under test (CUT) areperformed before the test stage by investigating the response ofthe circuit under test in faulty and fault-free conditions. Follow-ing this, two signatures parameters—output voltage and supplycurrent—are observed and used for the fault diagnosis; the CUTis simulated using the OrCAD/PSpice software, and the output isanalyzed in the DC domain. This method is validated through aninverter amplifier based on the uA741 operational amplifier. Thenthe results of different experiments are presented to demonstratethe applicability of the proposed method by increasing its efficien-cy.
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