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Analysis of the coupling of electromagnetic pulses into shielded enclosures of vulnerable systems

机译:电磁脉冲耦合分析到弱势系统屏蔽外壳中的耦合

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In order to predict the immunity to electromagnetic interference of vulnerable systems, not only the electronic system but also its enclosure has to be taken into consideration. In this work, the coupling behavior of electromagnetic pulses?(EMP) and continuous wave?(CW) signals into the shielded enclosure of a generic system is investigated by metrological and numerical methods. Since this enclosure forms an unwanted or parasitic cavity resonator, the enclosure`s resonance behavior as well as the characteristic quantities, i.e., the resonance frequencies and corresponding quality factors are of great interest, too. The usage of an optical field sensor reduces the influence of the measuring setup on the investigated system and thus, enables the analysis of the enclosure's resonance behavior, which delivers revealing information about the dependence of the quality factor on the aperture size of the enclosure.
机译:为了预测易受攻击系统的电磁干扰的免疫力,不仅需要电子系统,而且还必须考虑其外壳。在这项工作中,通过计量和数值方法研究了电磁脉冲的耦合行为?(EMP)和连续波(CW)信号进入通用系统的屏蔽外壳中。由于该外壳形成有不需要的或寄生腔谐振器,因此外壳的共振行为以及特征量,即谐振频率和相应的质量因素也非常兴趣。光学场传感器的使用减少了测量装置对研究系统的影响,因此可以分析外壳的共振行为,从而提供了关于质量因子对外壳的孔径尺寸的依赖性的信息。

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