首页> 外文期刊>Solar RRL >NH_4Cl-Modified ZnO for High-Performance CsPbIBr_2 Perovskite Solar Cells via Low-Temperature Process
【24h】

NH_4Cl-Modified ZnO for High-Performance CsPbIBr_2 Perovskite Solar Cells via Low-Temperature Process

机译:NH_4Cl改性的ZnO通过低温过程用于高性能CsPbIBr_2钙钛矿太阳能电池

获取原文
获取原文并翻译 | 示例
           

摘要

Recently, the thermally stable and facilely fabricated inorganic CsPbIBr_2 perovskitesolar cells (PSCs) have attracted tremendous attention where the electrontransport layer (ETL) is vital. However, the typical sintering temperature forthe widely used electron transport material, that is, TiO_2, is more than 400℃,elevating the cost and hindering the application. Due to high electron mobilityand low fabrication temperature, ZnO becomes a desirable alternative for TiO_2,as the ETL in CsPbIBr_2 PSCs, albeit with low open-circuit voltage (Voc). Herein,this work introduces a trace of NH4Cl to the sol–gel-derived ZnO precursor todecrease the work function of the ZnO film, tune the surface morphology of theperovskite film, and thus suppress the density of trap states in the CsPbIBr_2 films.Consequently, full-coverage and pure-phase CsPbIBr_2 films consisting of micronsizeand high-crystallinity grains are obtained. More importantly, for the optimalNH4Cl-modified ZnO, a shining improvement in V_(oc) from 1.08 to 1.27 V booststhe champion CsPbIBr_2 PSCs to obtain a power conversion efficiency of 10.16%,which is the highest value reported among pure-CsPbIBr_2 PSCs under a lowfabrication temperature of 160 ℃. In addition, the NH4Cl-modified ZnO ETLreduces the severe hysteresis and increases the device stability significantly.
机译:最近,热稳定且易于制造的无机CsPbIBr_2钙钛矿太阳能电池(PSC)在电子传输层(ETL)至关重要。但是,典型的烧结温度为广泛使用的电子传输材料TiO_2超过400℃,增加了成本并阻碍了应用。由于高电子迁移率且制造温度低,ZnO成为TiO_2的理想替代品,CsPbIBr_2 PSC中的ETL,尽管开路电压(Voc)低。在这里这项工作在溶胶-凝胶衍生的ZnO前体中引入了少量的NH4Cl。降低ZnO膜的功函数,调整ZnO膜的表面形貌钙钛矿膜,从而抑制了CsPbIBr_2膜中陷阱态的密度。因此,由微米级组成的全覆盖和纯相CsPbIBr_2薄膜得到高结晶度的晶粒。更重要的是,为了获得最佳NH4Cl改性的ZnO,将V_(oc)从1.08 V提高到1.27 V冠军CsPbIBr_2 PSC获得了10.16%的功率转换效率,在低的情况下,这是纯CsPbIBr_2 PSC中报告的最高值制造温度为160℃。此外,NH4Cl改性的ZnO ETL降低了严重的磁滞现象,并显着提高了器件的稳定性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号