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Analysis of Series-Connected IGBTs Protection Method Under Short Circuit II

机译:短路下串联IGBT的保护方法分析II

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The difference between single and series-connected insulated gate bipolar transistor (IGBTs) during short circuit II (SC II) is analyzed contrastively, and requirements for an improved protection have been advanced to solve the SC II problem of series-connected IGBTs. A new principle of short circuit protection based on the logic of SC II fault processing used by the main control unit was proposed, using an active voltage clamping circuit to balance the dynamic voltage during breakdown, using an RC circuit to balance the voltage during tail current stage, and a formula to estimate the absorption capacitance and the selection principle of static voltage balancing resistance was proposed. The parameters under the actual test condition was given, the short circuit test system of series-connected IGBTs established, and the experimental verification carried out under the actual conditions. The result shows that under a Vbus of 1400V (2.65kV maximum peak voltage for each IGBT), the new protection method can provide synchronization of protect operation and voltage balancing during turning-off process, and the unbalance of steady stage voltage is under 5%.
机译:对比分析了短路II(SC II)期间单连接和串联连接的绝缘栅双极晶体管(IGBT)之间的差异,并提出了改进保护的要求,以解决串联IGBT的SC II问题。提出了一种基于主控制单元SC II故障处理逻辑的短路保护新原理,利用有源电压钳位电路来平衡击穿时的动态电压,使用RC电路来平衡尾电流时的电压。提出了估算吸收电容的公式和静态电压平衡电阻的选择原理。给出了实际测试条件下的参数,建立了串联IGBT的短路测试系统,并在实际条件下进行了实验验证。结果表明,在1400V的Vbus(每个IGBT的最大峰值电压为2.65kV)下,新的保护方法可以在关断过程中实现保护操作和电压平衡的同步,并且稳态电压的不平衡度低于5%。 。

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