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Analytical Electrothermal Modelling of Multilayer Structure ElectronicDevices

机译:多层结构电子器件的电热分析模型

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In this paper we present an analytical model to optimize the thermal and electrical layout for multilayer structureelectronic devices through the solution to the non-linear 3-D heat equation. The thermal solution is achieved by theKirchhoff transform and the 2-D Fourier transform. The model is general and can be easily applied to a large variety of integrateddevices, provided that their structure can be represented as an arbitrary number of superimposed layers with a 2-D embedded thermal source, so as to include the effect of the package. Moreover, it is independent on the specific physicalproperties of the layers, hence GaAs FETs, HBT and HEMTs as well as Silicon and Silicon-On-Insulator MOSFETsand heterostructure LASERs can be analyzed
机译:在本文中,我们提出了一个解析模型,通过求解非线性3-D热方程来优化多层结构电子器件的热和电布局。通过基尔霍夫变换和二维傅里叶变换获得热解。该模型是通用的,并且可以轻松地应用于多种集成设备,只要它们的结构可以表示为具有2-D嵌入式热源的任意数量的叠加层,从而包括封装的效果。此外,它与层的具体物理特性无关,因此可以分析GaAs FET,HBT和HEMT以及硅和绝缘体上的MOSFET MOSFET和异质结构激光

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