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首页> 外文期刊>The Journal of Advanced Prosthodontics >Interfacial modulus mapping of layered dental ceramics using nanoindentation
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Interfacial modulus mapping of layered dental ceramics using nanoindentation

机译:使用纳米压痕法对层状牙科陶瓷的界面模量作图

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PURPOSE The aim of this study was to test the modulus of elasticity ( E ) across the interfaces of yttria stabilized zirconia (YTZP) / veneer multilayers using nanoindentation. MATERIALS AND METHODS YTZP core material (KaVo-Everest, Germany) specimens were either coated with a liner (IPS e.max ZirLiner, Ivoclar-Vivadent) (Type-1) or left as-sintered (Type-2) and subsequently veneered with a pressable glass-ceramic (IPS e.max ZirPress, Ivoclar-Vivadent). A 5 μm (nominal tip diameter) spherical indenter was used with a UMIS CSIRO 2000 (ASI, Canberra, Australia) nanoindenter system to test E across the exposed and polished interfaces of both specimen types. The multiple point load – partial unload method was used for E determination. All materials used were characterized using Scanning Electron Microscopy (SEM) and X – ray powder diffraction (XRD). E mappings of the areas tested were produced from the nanoindentation data. RESULTS A significantly ( P CONCLUSION The liner between the YTZP core and the heat pressed veneer may act as a weak link in this dental multilayer due to its significantly ( P
机译:目的本研究的目的是使用纳米压痕测试氧化钇稳定氧化锆(YTZP)/单板多层界面的弹性模量(E)。材料和方法YTZP核心材料(德国KaVo-Everest)样品涂有衬板(IPS e.max ZirLiner,Ivoclar-Vivadent)(类型1)或烧结后(类型2),然后贴面可压玻璃陶瓷(IPS e.max ZirPress,Ivoclar-Vivadent)。将5μm(标称尖端直径)球形压头与UMIS CSIRO 2000(澳大利亚堪培拉的ASI)纳米压头系统一起使用,以测试两种样品类型的裸露和抛光界面上的E。 E的测定采用了多点加载–部分卸载的方法。使用的所有材料均通过扫描电子显微镜(SEM)和X射线粉末衍射(XRD)进行表征。从纳米压痕数据产生测试区域的E图。结果A显着(P结论。YTZP芯和热压饰面之间的衬里由于其显着(P

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